When interpreting SIMS (secondary ion mass spectrometry) data obtained on organic (polymeric) surfaces how much can one rely on MS databases which usually contain electron ionization MS data? How similar are the fragmentation tendencies?
There is a lot that goes into interpreting spectra obtained from SIMS. There are a few questions regarding this. Was SIMS performed under static or dynamic conditions? What was the ion source being used? I would assume that using MS data from EI sources may give you an idea of what you're noting in the SIMS spectra, but like with any other ion source in MS the spectra are influenced by the parameters used.
Dear David, thank you for your response. I will get data from anotther group. I just wonder whether the EI mass spectrometric literature of assumed species (fragments) may help in identifying the segments of an unknown sample obtained by SIMS technique.
I concur with David.
From experience I know EI analysis can serve as inspiration for SIMS interpretation, but there are very pronounced differences in relative peak intensities and repeat patterns observed for starters. Which as David highlights depend on the primary ion beam and indeed on the state of the sample if it is not a smooth, thin film on a conducting substrate. And at times rather unusual and at first glance unexpected fragments can appear in SIMS... Why don't you have a look at the SIMS database available from Surface Spectra? Alex Henderson is a very knowledgeable and helpful guy and can advise you whether this would be of use to you. I'd certainly also have a look at the wealth of literature available on a wide range of polymers - keeping in mind that older work tends to show a lot of fragmentation and limited higher mass information if it is pre-cluster source.
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