The quality should be a guarantee of your supplier. When you use an analytical technique, you should track the elements that constitute a failure in the quality of your material. XRD and Raman might be to expensive techniques to do that. You might try use EDS that is part of the SEM technique. This technique gives you the elements present on the surface of your material. If you need a quality control, talk to the supplier for a quality certificate.
The best way to ensure the quality of graphene depends on its applications, i.e. where will you use that graphene. If you want to use in electronics, then definitely electrical conductivity would be a prime choice. But for composite with graphene, Raman is the best way to judge the graphene quality. As it is known that Raman spectroscopy is the best characterization method for carbon materials where D band (defect band) and G band (graphitic band) ensure the quality of graphene from the their intensities. Moreover, being a spectroscopy technique, it is fast and provides the probable interactions within the composite also.
The best way to confirm the quality of any Graphene material is by doing the Raman Spectroscopy. Also, you can perform the AFM to measure the width of the layer. The number of layers of Graphene can be studied from the Raman spectra as well. Also by XRD, you can identify the phase of Graphene, whether it is a Graphene material or not.
There are few ways. You can do Raman but you need to scan your sample to make sure your grain sizes are large (large Graphene film). The 2D peak must be much larger than the D peak (good quality Graphene). Electrical measurements can also show the existence of defects in your film. I have shown this by both experimental and theoretical analysis (Yajadda Physica E Vol 64, 87-94 2014). One last comment, please everyone let's not to call how many layers of Graphene. Graphene is a single layer structure, above one layer is just an ultra thin graphite.
Maybe use an optical technique (for plane surface) spectroscopic ellipsometry, if you wanna detect it in microscopic way imaging ellipsometry is a good method.
But there are also for poduction line other techniques which are based on reflection "off-Null-ellipsometry".