I have already XRD data for TaN as deposited films. The samples have been deposited as different partial pressure of N2 using sputtering facility. Somehow, the vendor for the XRD systems has not installed the database for the peak identification. I would be highly thankful if some could help me in indexing the XRD peaks. I would provide the raw data obtained after the XRD.
Thanks.
Atilla Atli
You can use "Match!" software for 2 months free of charge. Otherwise send the raw data please.
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Dirk Luetzenkirchen-Hecht
If you have an idea of the unit cell, then it is quite easy to index your diffractogram e.g. by using the powdercell software (which is entirely free). Good luck, Dirk
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