We are preparing thin films for applications in low cost solar cells. However we are experiencing problems for the characterization because of restrictions and unavailability of foreign divides in our country (must of our characterization equipment are out of service). If you are interested, please contact us.
What kind of films are you preparing? What kind of characterization do you need?
We are working on Cu2Zn(Ge,Sn)(S,Se,Te)4 materials. We need microscopy and optical characterization.
Many thanks for your answer.
Pedro
Dear P. Grima Gallardo, In our institute we have experience with optical characterization of thin films. We use UV-VIS-NIR spectroscopy and recently we have bought a spectral ellipsometer. Also we can do electron, atomic and optical microscopy. Contact me if you are interested for more details. Best regards
Thank you Dr. Babeva, this is exactly what we need. Please send to me the address where I can send the samples. I hope that we will developped a fruitful colaboration.
With my best regards
Pedro
Dear Dr. Gallardo the address is:
Institute of optical materials and technologies
Acad G. Bonchev Str., Bl. 109
1113 Sofia
Bulgaria
Best regards
Tsvetanka
Thank you Dr. Gwamuri, can you send me your address?
Best regards,
Pedro
Dear P. Grima Gallardo, we can do an XPS characterization of the surface nanolayers of the thin films. Is it interesting for you?
Dear P. Grima Gallardo,
We have 2 groups for the elaboration of thin films. The first reserved for silicon-based materials, the second for ZnO films.
In our Laboratory we use UV-VIS-NIR spectrophometry in order to determine the optical constants (refractive index, optical gap,…), a Perkin-Elmer Infra-Red Spectrometer for the determination of chemical bonding nature of the films and since 2013 a spectroscopic ellipsometer.
We also specialize in electrical measurements (CV, IV, CVw, GVW, TSC, TSCAP, .....).
If you are interested you can contact me for more details.
Pr KECHOUANE Mohamed
Best regards
Dear Dr. Kondrat,
Many thanks for your answer, of corse we are interesting in XPS measurements on our samples. Please send me your address.
With my best regards,
Pedro Grima
Dear Dr. Kechoane,
Thank for your answer. We are very interesting in the techniques for characterization available in your laboratory. Please send me your address so we can send you our samples.
With my best regards,
Pedro Grima
Dear P. Grima Gallardo, In our institute we have experience with microscopic characterization of thin films (metal, semiconductor, dielectric and other). We use atomic-force microscopy for investigation of morphology (statistical and fractal) and electrical properties (surface potential, spreading resistance, etc.) of thin films. We have a electron microscopy, X-ray analysis. Contact me if you are interested for more details. Best regards.
Dr. Novikov,
Thank you for your answer. Certainly we are interesting in stablish a collaboration with you. For the techiniques than are available in your laboratory I believe than we can investigate, not only thin films, but semiconductors in general. Please send me your adddress in order I can send you our samples.
With my best regards,
Pedro Grima
Dear P. Gallardo,
In our institute we have experience with thin films (PVD), we use FTIR spectrometer for investigation optical properties, elipsometer/profilometer for index of refraction/thickness, XRD for structural aAdd your answernd morphology and also a thermal analysis.
With my regards.
Pr. Adil Balhamri
Dear P. Grima Gallardo
Pr KECHOUANE Mohamed
Laboratoire de Physique des Matériaux, Faculté de Physique, USTHB
BP 32, El Alia, Bab Ezzouar, Alger, Algeria
Best regards
Dear P. Grima Gallardo, In our laboratory we have experience with electrical and optical characterization of thin films (metal, semiconductor, dielectric and other). Contact me if you are interested for more details. Best regards.
Dear Dr. Beji,
Many thanks for your answer. Please send me your address and I will send you our samples. I hope that we can beginning a fruitful collaboration.
With my best regards,
Pedro Grima
Dear Professor,
it's a pleasure to cooperating with you. My address is:
Lotfi Beji. Institut Supérieur d'Informatique et des Techniques de Communications. Gp1. 4011 Hammam Sousse. Tunisie
my email address is: [email protected]
Good Morning,
In our Research Structure, we have Jandel technique for performing four-point probe measurements on semiconductor thin films.
Best regards
Prof. Abdelfettah BARHDADI
-----
Semiconductors Physics and Solar Energy Research Team (Head)
Physics Department (Head)
Ecole Normale Supérieure, University Med-V, Agdal
P.O. Box. 5118, Takaddoum, Rabat, Morocco
Mobile: (+212) 664 936 815
http://users.ictp.it/~barhdadi/
E-mail: [email protected] / [email protected] / [email protected]
- Badges
- Science topic
- Similar topics
- Physical Sciences
- Materials Science
- Materials
- Semiconductor