There could be several different reasons, some of them being intrinsic to your material, and some other being instrumental:
- systematic error originating from the diffractometer (zero position, ...) or position of the sample
- increase of the lattice parameter if your particles are nano, or if the actual stoichiometry is slightly different
- (...)
Best thing to do in my opinion would be to perform Rietveld refinement of your diffraction pattern (ideally using an internal standard while recording the XRD pattern).
There could be several different reasons, some of them being intrinsic to your material, and some other being instrumental:
- systematic error originating from the diffractometer (zero position, ...) or position of the sample
- increase of the lattice parameter if your particles are nano, or if the actual stoichiometry is slightly different
- (...)
Best thing to do in my opinion would be to perform Rietveld refinement of your diffraction pattern (ideally using an internal standard while recording the XRD pattern).
The peaks shift could also be due to the strain in your crystals, especially when all peaks are shifted towards one side, which can also be worked out through Rietveld refinement.
Diffractometer zero shift is constant (+/_) and do not vary with 2 theta, which seems to be probable reason in your case, as you mention all peaks are equally (constant) shifted towards left (i think you have compared with literature or JCPDF data). Not only peak positions but also their difference matters which the Rietveld method take care, if proper parameter is refined.
In xrd pattern the shift are arising basically two reasonas one is for temperature effecg and other one due to some strain induce . i have no idea about your materail that whether it is temperature sensetive or not . its may be some strain induec effect also .