I am doing the characterisation of the EUV photo resist . I tried to do the PSD analysis in the CD-SEM image after lithography but unfortunately the execution fails due to the poor contrast. why the contrast is low after the lithography in CD-SEM ?
Do you mean 'blurred images'?
08 September 2015 311 2 View
08 September 2015 271 0 View
08 September 2015 2,535 3 View
03 March 2021 8,272 1 View
I have selected brain tumor images ...but now found that already lots of research done n this topic.
03 March 2021 5,774 3 View
i am try to classify the x-ray images. During classification , can i block unwanted images (except x-ray image).
03 March 2021 7,100 1 View
Need to image mesoporous silica nanoparticles using the TEM. Also, need high resolution TEM images to see the mesoporous structure. Kindly suggest what kind of grids to use. Thanks, Shatadru
02 March 2021 1,787 2 View
I did sds page to determine the difference in protein expression between 3 types of vaccine , but i don't have scanner or densitometer available. . so i wonder if there is a software to analyze...
02 March 2021 6,270 3 View
Dear Colleagues, After running Western blot on PVDF membrane and detection using ECL, I would like to stain my PVDF with colloidal gold to be able to allign the ECL image with total proteins on...
02 March 2021 7,829 3 View
I would like to research on MR images (0.5T and 3T). Can you please suggest some websites that I can download dataset including both 0.5T and 3T MR images? Thank you.
02 March 2021 7,735 3 View
Hello, I would like to ask how to grow E.coli which resists 50 or 100ug/ml of Blasticidin. I have tried many methods by using low salt Luria-Bertain(LB) agar plate. However, no colonies grow. Let...
01 March 2021 2,027 2 View
Hello, I have classified 10 S3 OLCI images from the same area (althouth not the same size and/or quadrant) and I would like to do a final image using the mode of the pixel of these 10 images. I...
01 March 2021 9,874 3 View
Favourable conditions of base pressure, rate of deposition. Also, by which characterisation technique to be used to verify the thickness of the deposited film.
28 February 2021 3,640 3 View