Hi
I got a low confidence index in the EBSED analysis even after days of polishing using 1 to 0.02 um suspension using 1 lb force, the sample was Al/W composite (has intermetsllic interface) prepared by 3D printing. Can you please tell me why is that happen and how I can improve the CI
thank you
Hi,
- Did you choose the correct phase(s) for indexing?
- Is the pattern center calibration correct? Specifically, did you choose the correct working distance in the EBSD software?
- Do your EBSD patterns look acceptable, i.e. can you recognize an EBSD pattern?
Tijmen
thanks Tijmen for your answer,.
I re-calibrated the measurements by using Ni sample that came with the device then I got a better confident index (0.2) for my sample. The intermetallic phase has been recognized but not the main phases (Al & W)!
I do not quite understand what you meant by "choose the correct working distance in the software", is it should the same for the SEM working distance (18 mm) or different?
thank you
Did you do the calibration on the same working distance as you did the scans, and did you make sure that the calibration was saved?
The WD should be the same in the software as for the SEM, to make sure that the correct calibration is used.
For the Al & W phases, do you recognize Kikuchi patterns by eye? Are you sure you know the crystal structure, i.e. are they FCC and BCC for Al & W? (I guess so) Did you choose these phases for indexing?
I did the calibration using 15 mm WD, and it worked well with my sample (CI 0.36).
for the Al and W, I have the STL database.
but still don’t able to get the grain map and not sure what SEM magnification should use to get the map
thank you
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