I recently conducted an AFM of metal oxides to get information about the size, shape, and arrangement of the grain. However, I couldn't find any grains in the obtained result (procedure for AFM image done by using Gwyddion software). This result brought me confusion, which could be due to analysis issues or possibly my incorrect interpretation. However, I have received the correct results of XRD, FTIR, and FE-SEM of the same material, which suggests that there is no issue with the synthesis method. Anyone who has experience with AFM will help me solve this issue. Thank you so much for the time.
It would be nice to have the FE-SEM image of the same sample showing the grains. I am curious if the scales are the same. AFM could be scanning a much larger or smaller area. If you are only scanning a partial grain by AFM, it will not be helpful.
What is the z-scaling on your sample? I saw a local researcher have severe tilt on their sample from side to side. The little bit of surface variation was dwarfed by the tilt.
And if you have grains by FE-SEM, why are you doing AFM? Or was FE-SEM done for some other purpose? (I cannot see how FTIR would add information about grain structure. XRD could.)
dear Muhammmad Hashim Khan
Gwyddion grains analysis tool uses height threshold to separate grains. First you would need to get rid of the yellow-brown area in you image so that you can really have a better look into the height distribution to set a good height threshold percentage .
best regards
Paco
I do not think whatsup image will help. All I can see is blurred picture w/o any grains. I do not think Gwyddion or/and other software will work as "magical wand". At the first, sample has to be prepared well, shall be flat. If it will be flat you will be able to get 50x50 um image. As far I see (or just suppose) it is high roughness surface. If so, use TappingMode (for topography) and turn on PhaseImaging channel for differences, such as grain boundries - take look at my results made on human tooth (w/o scale bar). For any software which will count peeks you have to get perfect AFM image for it. 3D image is a nanopowder on mica surface - sample prepared by me for automatic grain size measurements. If you put a little more effort into preparing the samples, you will be able to do 'some' auto-measurements. And last tip - try to use WSxM to see the height levels on the obtained topography.
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