As we know, surface and/or interface roughness have a significant influence on election density during X-ray reflectivity measurement. The amplitude of oscillation decreases with increasing interface roughness, which varies the electron density along the thickness. My question is, is there any influence in thickness with increasing surface and/or interface roughness in surface in XRR analysis?
Thank you in advanced for your kind help.
Dear Mr. Rashed,
I would like to strongly recommend a book chapter written by my thesis adviser, Prof. Dr. Tilo Baumbach:
T. Baumbach, P. Mikulik; Chapter “X-ray reflectivity by rough multilayers”, p. 232-278 in “X-ray an neutron reflectivity, principles and applications”, Lecture Notes in Physics 58 edited by A. Gibaud and J. Daillant, Springer-Verlag, Berlin Heidelberg (1999), ISBN 3-540-66195-6
This should help. Some basic principles of X-ray reflectivity (how the film thickness and surface roughness influence the features in XRR results) you could also find in my thesis:
https://www.researchgate.net/publication/268448002_Characterization_of_Growth_and_Real_Structure_of_Nitride_Based_Semiconductor_Devices_by_Use_of_Synchrotron_Radiation
Best regards,
Bojan Miljevic
Thesis Characterization of Growth and Real Structure of Nitride Bas...
Dear Abu Rashed,
people are in fact extremely interested in those thickness-roughness relations (named "scaling laws" in leterature), as they might tell you many details e.g. about the growth mode of thin films. Check e.g. the (theoretical) works of Krug and coworkers (the most cited is probably "Origins of scale invariance in growth processes", Adv. Physics 46 (1997) 139-282, DOI:
10.1080/00018739700101498 , or check "Fractals, Scaling and Growth Far from Equilibrium" from Paul Meakin, Cambridge Univ. Press) and experimental studies for extremely different types of materials such as the new graphene layers (e.g. http://www.nature.com/articles/srep20907), polymer films (e.g. http://journals.aps.org/prl/abstract/10.1103/PhysRevLett.73.708) or metals and alloys (http://journals.aps.org/prl/abstract/10.1103/PhysRevLett.89.190601).
Hope this helps, kind regards, Dirk
Dear Mr. Rashed,
I would like to strongly recommend a book chapter written by my thesis adviser, Prof. Dr. Tilo Baumbach:
T. Baumbach, P. Mikulik; Chapter “X-ray reflectivity by rough multilayers”, p. 232-278 in “X-ray an neutron reflectivity, principles and applications”, Lecture Notes in Physics 58 edited by A. Gibaud and J. Daillant, Springer-Verlag, Berlin Heidelberg (1999), ISBN 3-540-66195-6
This should help. Some basic principles of X-ray reflectivity (how the film thickness and surface roughness influence the features in XRR results) you could also find in my thesis:
https://www.researchgate.net/publication/268448002_Characterization_of_Growth_and_Real_Structure_of_Nitride_Based_Semiconductor_Devices_by_Use_of_Synchrotron_Radiation
Best regards,
Bojan Miljevic
Thesis Characterization of Growth and Real Structure of Nitride Bas...
Dear Bojan Miljevic,
Thank you for your kind suggestion and hope your thesis help me to understand XRR phenomena deeply.
As you mention roughness (might top surface roughness) decay the X-ray reflectivity faster and reach to the background.
In this case, have any influence in the period of oscillation that determines films thickness? That means if roughness is high, is there any possibility to provide longer or shorter period of oscillation?
Please suggest, if possible.
Best regards,
Md. Abu Rashed
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