The Van-der Pauw Hall measurement techniques is used to measure carrier mobility as well as carrier concentration. Supporting this I have attached a paper. Please see this. My doubt is we are interested to measure the 2DEG carrier density in cm-2 not in cm-3. For this I have to multiply the thickness of the interface layer where 2 deg is formed. So I am interested to how to calculate the the thickness of interface to calculate the exact value of 2DEG in heterostructure?
Hi. Interesting question. As you know 2DEG forms due to lattice mismatch and strain generation or defect formation leading to band bending at the interface of two potential materials. So generally the physical dimension of these are known to be few angstroms. More specifically, few unit cells. Such a thickness can be detected in angle resolved hard X-ray PES.
These two articles may help you:
http://palgong.knu.ac.kr/~optolab/pdf/041APL.pdf
http://www.bnl.gov/ps/nsls/workshops/2009/haxpes/files/Claessen.pdf
- Badges
- Science method
- Similar topics
- Biological Science
- Ecology