I have carried out XPS analysis of CNFs/ACF samples to know the nature of C1s, O1s spectrum. I have often seen that people use mixed Gaussian Lagrangian function to interpret the results. What is the necessity of doing this?
Sorry Bhaskar, people use Gaussian - Lorentzian functions. The reason is that the profile of the measured XPS data is not only originating from the atomic level considered, but also from the instrument and its resolution. Thus it might be that XPS profiles are often best described by a mixed function. Further effects may arise if you have a metallic species. In this case, the ejected photoelectrons may interact with the conduction electrons, loosing very small portions of energy. This may be accounted for by using an additional tail function (i.e. the peaks are asymmetric. Hope this helps, kind regards, Dirk
Sorry Bhaskar, people use Gaussian - Lorentzian functions. The reason is that the profile of the measured XPS data is not only originating from the atomic level considered, but also from the instrument and its resolution. Thus it might be that XPS profiles are often best described by a mixed function. Further effects may arise if you have a metallic species. In this case, the ejected photoelectrons may interact with the conduction electrons, loosing very small portions of energy. This may be accounted for by using an additional tail function (i.e. the peaks are asymmetric. Hope this helps, kind regards, Dirk
Dirk made valid argument on use of mixed Gaussian-Lorentzian functions while analyzing XPS peaks. If you are dealing with carbon nanotube forests, you might be able to get away with using 100 % Gaussian peak profile. Metallic peaks are Lorentzian (having extended tails) and polymeric samples usually yield Gaussian peaks. Nevertheless, because of instrument factors, the peak profiles are often not ideal, therefore a mixed function. A careful peak fitting approach along with literature research will give you the ratios of Gaussian to Lorentzian character in the peak.
Could you please tell me which software you use to process the XPS data. Also, could you please send me the link of one paper which describes the C1s and O1s spectrum incorporating the Gaussian Lorentzian mixed functions... Thanks in advance...
I believe that the G/L ratio is instrument-dependent (and pass-energy dependent), meaning you can't use the values used by someone else on a different system under different parameters.
Popular free software for XPS analysis include CasaXPS and PEAKFIT, both can be downloaded here:
In fact, the mixed Gauss-Lorentz function is an approximation of Voigt function that is a convolution of gaussian and Lorentzian components. The lorentzian come from inherent line shape, i.e. the photoemission process and the gaussian comes from spectrometer and broadening from slightly different local bonding. As it was mentioned earlier, the G/L ratio is instrument-dependent (and pass-energy dependent) because of gaussian dependency. In modern software packages for peak fitting you can choose to use convolution of Gauss and Lorentz functions (Voigt function) which is more precise. Moreover, the inherent line width given by lorentzian component with should be instrument independent. The recent computer have so high computing power that the approximation is no longer needed compared with the situation 20 years ago.
Bhupinder Singh wrote: If you are dealing with carbon nanotube forests, you might be able to get away with using 100 % Gaussian peak profile.
This is not true for the SWCNTs. In this case, the carbon configuration is graphitic, therefore the C1s line is strongly asymmetric, like in many metals.
You can read more about carbon spectroscopy in my paper: