.. I think you should better clarify what you would like to know!
I doubt you use diffraction to analyze an amorphous material, and with no information on geometry & material it is nearly impossible to give you any useful information
thanks for your interest,actually i use the X-ray Diffraction to analyze the structure of amorphous chalcogenide materials and I use the reflection geometry,can you tell me what the information needed about geometry and material
in that case I suggest you use the same corrections applied for the PDF analysis (that can give you information on the structure of your amorphous system). You can find the corrections in the book of Egami, T. & Billinge, S. J. L. (2003). Underneath the Bragg Peaks: Structural Analysis of Complex Materials. Oxford: Pergamon/Elsevier
All those corrections are implemented in the PDFgetX software. If you do not work with a sufficiently high Q range it is unlikely you''l get a proper PDF, but I think you should be able to get the corrected pattern out
i am already work on PDF analysis and I have this book,the book suggest for the background correction i make a scan with empty sample holder and subtract the result intensity from the measured intensity ,so i will use this method at the moment
thank you again
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