I have 2 different particle size of silicon dioxide or silica nanoparticles such as in the range of (10-20 nm) and (50-100 nm). So, what will be the differences between these two whether in any of their properties or any changes in XRD/ XPS analysis? Kindly please explain it properly. Thank you.
XRD is mainly used to determine - lattice parameters, internal stress/strain (elastic), and coherently scattering domain size (crystallite size). XPS is mainly used to determine - oxidation state, and surface chemical composition. Their field of application is non-overlapping, therefore can not be compared.
So, as per se your query states, I must say that there is only a difference in the size of these sample particles. Their property may differ subject to changes in their surface chemistry or in their application parts wrt interacting molecules.
XRD will show a broadening of the reflections lines of smaller particles.
https://www.nature.com/articles/s42004-018-0049-4
Article Evaluation of particle size reduction and agglomeration in d...
XRD & XPS throw light on different aspects of materials as stated by Mikhail & Sankalp. Differing particle size will have its own reflection on property profile.
I think there are similar in XRD but you should try XPS analysis because in XPS can find the structure of silica nanopoarticles and after that search about other properties in nano particles such as zeta potential, PI etc .@Ipsita Priyadarshini
- Badges
- Science topic