Dear RG members,
I analysed a samples twice in XRF analyzer with two different options first "Oxides-analysis" and second was "Elemental-analysis". With the first option, the % of SiO2 was 66, whereas in the second option the % of Si was 59. However, based on the atomic mass, the % of Si in SiO2 is 40. Therefore, the XRF should give 26.4% of Si, if SiO2 is 66%. Can anyone please justify this?
Thanks,
Mohit