Energy dispersive X- ray spectroscopy (EDS or EDX)
Wavelength dispersive X- ray spectroscopy (WDXRF or WDS)
If we have ZnO/Si which one detects oxygen?
In addition to what was said above - check that your EDX detector is either working without any X-ray window, or that the window is thin enough so that the soft X-rays coming from the oxygen (ca. 0.52 keV photon energy only) may reach the radiation detector. Note that a 10 micron thick Be window which is typically used for solid state X-ray detectors has an X-ray transmission of less than 0.1% at 500 eV photon energy (you may check the transmission of any window material at http://henke.lbl.gov/optical_constants/filter2.html).
With regard to wavelength dispersive analysis, same limitations may apply: For a chosen grating, the oxygen K-alpha and the Zn L-alpha (at around 1 keV photon energy) may be detectable, but the Zn K-alpha and the Si K-alpha may not be accessed with the same setup. If those higher energies should be measured as well, a different dispersive element (i.e. a crystal instead of a grating) must be used!
Good luck, Dirk
Dear colleage Kasim,
Energy Dispersive X-ray Analysis (EDX) can be used to investigate the properties and compositions of a broad range of sample types. EDX is used for chemical identification of elements and their concentration.
In EDX, electrons knock out electrons from atoms, producing X-rays of characteristic wavelength. These X-Rays are then detected to identify the element from which they were produced. In XRD, X-rays of known wavelength are used to probe the structure of the material, using the lattice as a diffraction grating.
To perform an EDX you need an electron source. For XRD you need an X-ray source.
If you are looking for chemical composition, concentration gradients, or solute segregation, use EDX.
If you are looking for phase distribution, lattice strain fields or stored defect content, use XRD.
hope this helping
Have a very good day
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