Four Point Probe Method [ Four Probe Method ] , get V-I values from the instrument and apply in the formula to get Conductivity values ............ for details on full formula check my answer given in this link https://www.researchgate.net/post/What_is_the_formula_for_measuring_conductivity_of_a_small_slab_of_sample_of_uniform_thickness_using_four_probe_method2
It depends on what sort of conductivity you are talking about... For in-plane electrical conductivity (I assume this is what you mean) you can use the four point probe method which gives you sheet conductance across the film surface. You can also use the Van der Pauw method. If you are interested in through-plane conductivity you will need to sandwich your film between two conductive plates and use electrochemical impedance spectroscopy. To calculate conductivity from EIS, you will also need the film area and thickness. Hope this helps.
Dear Weike,
Four-probe conductivity measurements are definitely the best option.
SALUT!
Tony
Impedance spectroscopic study is the best way to measure the resistance of Pani thin films if you have the facility otherwise as the others mentioned above you can try four point probe method.
Thank you, for the four-probe conductivity , Is there some special requirements about the polyaniline thin film？ should be very smooth or flat？ and something else?
Ensure that the probes sits correctly in your sample , a smooth and conducting surface will be a great advantage to get perfect I-V values , in case if you cant cast it into thin film then make it as a pellet [ disk type] with less thickness [ not more than the distance between any two probes ] ....... all the best
make a pellet using hydraulic pelletizer, the same, used for making KBr FTIR pellets.
then you can do your Four-probe conductivity measurements
http://www.internationalcrystal.net/iclsite3/icl71.htm
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