11 November 2015 10 7K Report

As a rule, BJT output characteristics are presented as a family of particular characteristics representing the function of the collector current IC of the collector-emitter voltage VCE while the base current IB is kept constant as a parameter. Maybe this two-dimensional way of presentation is widely used since it is convenient for printing on paper...

When we automatically measure and plot BJT output characteristics by a computer (even the primary Apple II), we have the unique chance to present them in a more attractive three-dimensional way. Now the collector current is a function of two variables - the collector-emitter voltage and the base current; IC = f(VCE, IB). The image on the screen is a surface, in which the particular characteristics IC = f(VCE) are represented by separate vertical sections of this surface.

I implemented this attractive experiment in the early 90's when I was trying to make vocational teachers in Bulgarian carry out real computer experiments in the semiconductor laboratory... but they proved unprepared for this... A program written on MLBASIC (an assembler extension of the embedded interpretator) was controlling an Apple computer equipped with an analog periphery - 4 DACs, 4 ADCs, power voltage-to-current and current-to-voltage converters (described, regretfully only in Bulgarian, in the attached link after the pictures below).

It is amazing that then I had no idea that I will reproduce this attractive experiment with my students whole 25 years later...  and really I will start doing it today... I made a "dress rehearsal" of the "show" at the university on Saturday evening. It was too late and dark in the laboratory... so movies I made were very poor (there was a mistake in the camera settings)...

https://drive.google.com/open?id=0B45uRPpHPD9hb3JabVh1alRFcmM

(Measuring of a 3-dimensional transistor output characteristic by MICROLAB)

https://drive.google.com/open?id=0B45uRPpHPD9hMWdzZW5MQzJxTTg

(Plotting a 3-dimensional transistor output characteristic on the screen)

https://drive.google.com/open?id=0B45uRPpHPD9hY3dyY1JLc0dvQ0k

(Temperature influence)

This question is closely related to the questions below:

https://www.researchgate.net/post/Why_do_we_use_Ib_instead_Vbe_as_a_parameter_when_measuring_common-emitter_output_characteristics

https://www.researchgate.net/post/How_do_students_investigate_semiconductor_devices_in_the_lab-manually_or_automatically

https://www.researchgate.net/post/How_do_we_investigate_semiconductor_devices_in_the_educational_lab

https://www.researchgate.net/post/How_do_we_investigate_the_IV_curve_of_a_forward_biased_diode-by_a_current_voltage_or_real_source

It would be interesting for me to see what you think about this way of presentation. Is it the actual output transistor characteristic or only another attractive presentation?

https://drive.google.com/open?id=0B45uRPpHPD9hcm5rOEEyaGlrMzA

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