FTIR, ATIR, EDX, elemental mapping, DLS, Zeta potential measurement, BET-analysis, XRF, XPS, SEM, AFM and Ramman spectra are common surface characterization techniques for nanoparticles.
FTIR, ATIR, EDX, elemental mapping, DLS, Zeta potential measurement, BET-analysis, XRF, XPS, SEM, AFM and Ramman spectra are common surface characterization techniques for nanoparticles.
You can use zeta potential meassurment to see what charge do you have. Than FTIR, BET analysis. If you have some molecules on the surface, you probably can not detect with miscroscopy and elemental analysis, since functional groups are not visible with TEM, SEM and therefor EDXS.
For functionalized nanoparticle characterization FTIR and Raman Spec is very useful, microscopy analysis is not useful for functionalization nanoparticle characterization.
Anna, the morphology of the nanoparticles can be confirmed by microscopic methods(TEM and SEM). For functionalization of nanoparticles FTIR, XPS, EDX. We can find CHNS analysis data for the organic moiety on nps in literature.
There are so many surface characterization techniques for functionalized nanoparticles. Some of the most advance instrumentation techniques for the surface characterization of functionalized nanoparticles are mention below:
(a) NMR (Nuclear Magnetic Resonance) spectroscopy 1H and 13C;
(b) FTIR (Fourier Transform Infrared in the transmission mode at 400 – 4000 cm-1 – degree of modification of the nanoparticles;
(c) Raman Spectroscopy
(d) TEM (Transmission Electron Microscopy) images – effect of modification of nanoparticles on their dispersion properties;
(e) EIS (Electrochemical Impedance Spectroscopy) – estimate the corrosion protection performance of the prepared coatings
(f) Electron spectroscopies (X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) are two analytical techniques to identify trace amounts of surface contaminants.),
(g) Incident ion methods (SIMS and LEIS); Low-energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface-sensitive analytical technique used to characterize the chemical and structural makeup of materials; Time-of-flight secondary ion mass spectrometry (ToF-SIMS) brings the power of mass spectrometry to surface analysis.
(h) Scanning probe microscopy (STM and AFM); Scanning Tunneling Microscopy (STM) captures images using quantum tunneling. and Atomic Force Microscopy (AFM) captures precise images by moving a nanometer sized tip across the surface of the image.
about surface characterization techniques for functionalized nanoparticles , I think the more suitable technique 1- TEM 2-FESEM 3- AFM 4- FTIR 5- Raman spectra
people/researchers. please do not suggest TEM as characterization method for functionalized paricles. becaouse you can obly see if there is some amorphous layer on it or not. and still thia layer can be contination during TEM session. also EDXS will always show you carbon. which is irrelavant since the grid is carbon coated.
Blaz Belec, I synthesized nanoparticle with green synthesis. By comparing the FTIR spectra of the plant and nanoparticle, I commented on which functional groups influence nanoparticle formation. With SEM-EDX analysis, I interpreted the presence and particle structures of metals.