Particle size may get from SEM, TEM, and particle size distribution, etc. I have done these three, got different sizes like SEM 60-80nm, TEM 10-40nm, and PSD 380nm. Anyone suggest me, what are the analysis is must do make sure Nanosize particle? Any other analysis is important other than these three? Why will it vary from one to another analysis?
If your results varies so much, there could also be a problem of particle size separation during sample preparation for TEM? e.g. if you are preparing a solution larger particles can sink before you prepare the TEM grids... An as Manish said, you must take into account the resolution of the method first (regarding PSD)...
Its depend on resolutoin and tem has best resolution so u should prefere tem or advanced tec of tem and resolution is depend on speciman also
If your results varies so much, there could also be a problem of particle size separation during sample preparation for TEM? e.g. if you are preparing a solution larger particles can sink before you prepare the TEM grids... An as Manish said, you must take into account the resolution of the method first (regarding PSD)...
You have to decide what is a primary particle, an aggregate, an agglomerate or cluster and also decide on whether you decide to measure number, length, surface, volume, or intensity properties. The EU definition is based on number (50% of particles by number below 100 nm) - this has issues of measurement: with this definition everything is nano including you and I. Different techniques measure different aspects or properties of the particle - you need to decide what is correct for the end use, application or required particle property.
Dear Mr. Siva Mani,
Basically, you can estimate the particles size from XRD data, by applying William-Hall method, or in general it is always being used the Scherrer's equation. Principally, I agree with the above experts. Different characterization techniques will give a different result of analysis, but if your sample exactly has good dispersibility and does not agglomerated or inform of aggregates, so the result of any analysis should give a close value. Although, the value might be not exactly same. For example, I have experience to measure the particles size by using TEM. The particles size obtained from TEM image was 30 nm and the size obtained from XRD data analysis by using William-Hall method is about 28 nm.
In general speaking, the higher resolution of instrument, the higher accurate of your result.
As all the above researchers have rightly pointed out that the resolution of the instrument and the topographical characteristics which are assessed are different so these differences.I think you should first ensure which instrument gives you maximum benefits.then select that analytical method and analyse various samples with it.If your goal is only particle size analysis,you should go with SEM/TEM,depending on your sample.
To characterize nano particles, SEM/FEGSEM high resolution images are useful. Most important is quantification of particle dimensions where use if ImageJ software could be helpful.
Thanks
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