Dear all, would you please go through this RG link. My Regards
https://www.researchgate.net/post/What_is_difference_between_XRD_and_XPS_methods/amp
Dear Fazal, XRD gives the information regarding crystallinity, lattice parmaeters and crystallite size of a sample whereas, XPS gives the information on elemental composition and the oxidation states in which they are.
X-ray diffraction (XRD) uses X-ray radiation reflected through crystal lattices along with Bragg’s law for identifying the phase composition of the material.
On the other hand, X-ray photoelectron spectroscopy (XPS) uses the principle of photoelectric effect to study the binding energies of released electrons which help in identifying the species of elements (ionic state)present in the material.
One can say that, XRD provides data on a crystalline level while XPS provides data on an atomic/ionic level.
Dear Fazal sir,
X-ray diffraction involves the measurement of the intensity of X-rays scattered from electrons bound to atoms of a crystal lattice. XRD analysis provides the bulk structural/ crystallographic information of samples such as crystal phase, composition, stress/strain, lattice parameters, preferred orientation and crystallite size.
Whereas, X-ray photoelectron spectroscopy (XPS) is a surface sensitive technique or normally called ESCA (Electron Spectroscopy for Chemical Analysis). In this surface sensitive technique, analyzing the energy of detected electrons from a sample by the photoelectric effect was performed to study the binding energies and chemical composition of species.
XPS technique is used to examine the electronic/oxidation states, binding energy, and chemical composition of samples and identify name of elements present in the surface region of a sample.
in other words, XRD examine crystallinity of a sample, while XPS tells about chemical states of a sample in atomic level.
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