I am working on single-walled carbon nanotube (SWNT) samples and observed an unexpected deviation in the XRD patterns. The (002) peak, which usually appears around 2θ ≈ 26° (interlayer spacing ~0.34 nm), is instead found at approximately 23° in my samples (see attached XRD plot).
Attached: XRD pattern showing the (002) peak shifted to ~23° in SWNTs
The SWNTs are pristine . The measurements were performed using Cu Kα radiation (λ = 1.5406 Å) within a 10–60° 2θ range, with a step size of 0.02°.
I would like to understand what could cause this shift of the (002) reflection towards lower angles.
Any references, experimental insights, or similar observations from other researchers would be greatly appreciated.
Thank you for your contributions!
Tags:
#SWNT #XRD #CarbonNanotubes #MaterialsScience #Nanomaterials #GraphiticStructure