14 February 2025 2 1K Report

I want to measure the electrons effective mass, concentration, and mobility in an AlAs/InGaAs quantum well on an InP substrate. Is there a book or guide on designing a Hall bar for such measurements?

My main uncertainties concern the following points:

  • Do I need to etch through the top layers to access the QW? If so, should I stop at the top barrier or reach the well itself?
  • Should the metallization cover only the top surface of the QW, or should it extend to the sidewalls as well?

I have found some papers on this topic, but they do not provide detailed fabrication procedures.

For reference, the epitaxial structure is as follows:

  • In₀.₈Ga₀.₂As cap (doped)
  • LM-InGaAs (doped)
  • LM-InGaAs (undoped)
  • AlAs
  • In₀.₈Ga₀.₂As
  • AlAs
  • LM-InGaAs (undoped)
  • LM-InGaAs (doped)
  • InP substrate"**
Similar questions and discussions