I don't know of any - 

we have a Perking Elmer UV/vis/NIR which will cover 0.2 - 3.3 micron

http://www.dit.ie/focas/facilities/perkinelmerlambda900uvvisnirspectrometer/

and a Perkin Elmer NIR/MIR system which will cover 0.7 - ~20 micron

http://www.dit.ie/focas/facilities/perkinelmerspotlightft-irmicroscope/

The Nicolet 6700 series can do reflectance (biconical, ATR, or integrating sphere) across that range, but you'll need to find someone with the appropriate beamsplitters and detectors. Our group can go down to 0.8 μm according to the specifications of our equipment, but no one here tries that range. We typically use an ASD FieldSpec 3 for bidirectional reflectance in the 350-2500 nm range and our FTIR for MIR reflectance from ~4-50 μm. 

You certainly cannot measure the reflectance in the UV-Vis and Attenuated Total reflection in the IR-Range and expect that both fit together. If your film is smooth, measure the specular reflectance with both instruments (e.g. with an Al mirror and polarizer!) and combine those.

Dear Mr. Zabri,

By comparing the results from your 2 instruments, you have discovered the wonderful world of measurement error and uncertainty. It can be very disconcerting, but on the other hand it can also be very revealing - giving you some idea of the accuracy of your measurements, and perhaps leading to improvements that may reduce the errors and provide more accurate results that you will have more confidence in. This is especially true when you compare results from instruments employing different methods, since they will tend to have different sources of error, rather than say a single instrument with different configurations - where the errors tend to be the very similar, which you could have for either a monochromator system or an FTS one, both of which could potentially cover the entire spectral range. 

So I suggest you may want to investigate common sources of error for both systems and see if you can get some standard samples with "known" reflectance, or have one of your own calibrated by a standards laboratory.

Dear Dr. Zakuan Zabri 

Have nice times and good day

This range of measuring the reflectance (R%) between 0.2 to 15 micron is very wide range, so and as I know there is no one apparatus can measure R% directly.

Therefore, I concur with Prof Thomas Mayerhöfer and Prof. Leonard M. Hanssen in their suggestions.

Good Luck

Thank you very much to all the researchers/prof/ lecturer for all the answers provided. It is a new thing for me and It is my pleasure here to learned new things from the senior in research field. Hopefully to get more inputs from all of you in future whenever I have a new question :)  

to my knowledge does not exist one spectrophotometer covering the whole field of wavelength that you explore (0,2-15 micron)

I think you have to measure separately.