Please guide me to calculate the reflectance for multilayer Anti-reflection coating in solar cell. Which method is best for the above calculation.
My advice is to check the matrix transfer method. It is the easiest and most elegant method if you use Matlab programing for example. Luck!
While you learn most if you do your own programming, it is also quite amazing what online resources already exist:
https://www.google.de/search?client=opera&q=thin+film+optical+online+calculator&sourceid=opera&ie=UTF-8&oe=UTF-8
As with all scientific software: (i) use wisely (ii) do not forget that there is no SW without bugs.
Dear Syed Sadique Anwer Askari,
Yes, I agree with Tsvetanka Baeva Mam.
Optical interference matrix is an effective way to calculate reflectivity in multilayer thin film.
The matrix method is usually employed for calculation of reflection coefficient.
The reflectance in multilayers is calculated by the optical admittance (Y ) which is the ratio of the total tangential magnetic (C) and electric fields (B).
I hope I have answered your question.
With Best Wishes,
Samir G. Pandya
I am not familiar with the matrix method - but does it work correctly when the wavelength of the light is similar to the thickness of the layers? Now you have to take wavelength and constructive and destructive interference effectgs into account.
The thickness of ARC is comparable to the wavelength of incident radiation. like thickness of ARC is 50-150nm for the wavelength 300nm to 1100nm.
For this condition, which method is best suited.
Briefly, in the transfer matrix method each layer in the multylayers system, along with the two semiinfinite media on top and botom of the system, are desribed by relatively simple matrix with dimension 2x2. The elements in the matrix include optical constants and thickness of the layer, angle of incidence and wavelength, of course. When you ascribe to each layer a matrix, you have to multiply all matrices and you will obtained again 2x2 matrix. Transmitance and reflectance are nothing but elements of the final matrix. Hopefuly, now it is more clearly.
There is the optical analysis of solar cell layers by the TCAD Silvaco. You can use it to calculate the reflectance of the multi layer structure.
For anti reflection coating you can make the layer optical path thickness = lambda/4 so that the the bounced radiation from back surface has a path difference of lambda/2 to sum destructively with the reflected radiation from the front surface. In this way one builds an interference filter for cancelling the reflected waves from the front and back surfaces. This concept can be applied for each layer. So, the thickness of the layer = lambd0/4 n , with n is the refractive index and lambda0 is the free space wavelength.
But is this concept is not used you can calculate the reflected radiation from the front surface and from the interfaces and the final reflecting surface between the anti reflective coating and the active layer.
If you assume that the incident radiation flux is Fi, then the reflected from the front surface R1= roh1^2 Fi, with roh1 is the reflection coefficient at the front surface.
The reflected from the the second surface R2= roh2^2 (1- roh1^2)Fi,
The reflected from the kth final surface is
Rk= rohk^2(1- roh1^2- roh^2- .............- roh^2)Fi
Assuming that the antireflective coating layers are lossless.
Then SUM of reflections from R1 to Rk must be minimum, from which one can get the thickness of the layers.
This is a straight forward analysis of the reflection from the multiple layers.
For complete analysis of the optical properties please see the link: Article M.S. Farid, A Zekry, A.A. El-Shazly, and M.A. El-Koosy, “Eva...
Best wishes
You can find this in Balanis book (Advanced Engineering Electromagnetics).
Hi,
The characteristic matrix method is a much effective way to calculate the reflectance of a multilayer system as you can be able to program it using matlab or any other programming language you are familiar with.
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