You can use CASA XPS software for data analysis, and in that software you can find the atomic percentage of different element present in your sample. you can also do the peak smoothening and many more process available in that software,
I suggest you to have a first look at some free XPS Handbook/paper, present on the web, that can be useful for identification and interpretation of XPS data; for example:
-Handbook of X-ray Photoelectron Spectroscopy
Available at: https://www.hic.ch.ntu.edu.tw/PES/file/%E5%8F%83%E8%80%83%E8%B3%87%E6%96%99/XPS%20handbook.pdf
or at: https://mmrc.caltech.edu/XPS%20Info/XPS%201995%20Phi.pdf
-Introduction to x-ray photoelectron spectroscopy
Fred A. Stevie and Carrie L. Donley
J. Vac. Sci. Technol. A 38, 063204 (2020); doi: 10.1116/6.0000412
Available at: https://mmrc.caltech.edu/XPS%20Info/Practical%20Guides%20to%20XPS/Intro%20to%20XPS.pdf
-A Review of XPS Data-Banks
B. Vincent Crist in SIA (2007)
Available at: https://www.nanolabtechnologies.com/wp-content/uploads/2018/04/Critical-Review-of-XPS-DataBanks.pdf
Enjoy reading and good luck !!!
My best regards, Pierluigi Traverso (CNR-IAS-Genoa).