Which one is better to study the distribution of reinforcement particles in the composite? Optical microscope or Scanning electron microscope?
It all depends on what you are looking for, since the penetration depth as well as resolutions for the optical microscopy and SEM are very different and depending on the electronic properties of materials those may vary from sample to sample. The resolution of optical microscopy is limited to the lower wavelengths of visible light, while that for SEM depends on the voltage applied, which can be translated as electron wavelengths. Moreover, in SEM you may be dealing with either backscattered electrons or secondary electrons, each of which gives you different depth profiles. However, overall you can achieve much greater resolutions with SEM as compared with optical microscopy.
Dear Prathap,
Optical microscopy and SEM could provide similar information, although the degree of application will depend on the type of material, and the size of the particles/nanoparticles on the composite. for very small sizes, obviously light microscopy is not an option...
Best,
Fran
Thinking outside the box: If the desire is to analize the particles within the matrix or the continuous phase material, the best option may be to use CT (computer assisted x-ray tomography). Instruments can have micrometer to nanometer level resolution, and you will be analyzing 3-dimential (3d) information. If not available to you, one can send the sample to a lab with a CT, or a CT manufacture to be analyzed for a fee. Very analytical data will be the result and any voids that might exist at the particle/matrix interface will also be evident in a non-disturbed condition.
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