Does an experimental technique exist that would be able to estimate the density (absolute or relative) of silicon dangling bonds on a sample surface?
Dear Aditya Saha :
I don't think there is such thing.
But indirectly, it may exist a method to determine this :
You can experimentally determine the Surface Energy of your Substrate. This can be done by the Contact Angle characterization, using a Contact Angle Goniometer (like the one shown in the picture), which you can calculate the Interfacial Tension between a liquid and the air, and/or between the liquid and your surface.
It is a very common characterization technique to measure the contact angle of the surface and from it, determine its Surface Energy. Several empirical models exist to do this.
Then, if you have a uniform enough Surface, and you can know the the Atomic Surface Density (rho_a) and the Bonding Energy (eps) between the atoms of Silicon, then you can indirectly calculate the number of Dangling Bonds present on the Surface, using the formula for the Surface Energy :
gamma = (1/2)*N_b*eps*rho_a (the formula is also attached in this reply)
where:
gamma : is de Surface Energy of the Substrate
N_b : is the Number of Dangling Bonds in the Surface
eps : is Bonding Energy of the Atoms (or given especies)
rho_a : is the Atomic Surface Density
Hope this can be useful,
Best Regards !:)
www.sciencedirect.com/topics/engineering/dangling-bond-density
www.sciencedirect.com/topics/engineering/dangling-bon…
Hi,
Hope this paper helps you:
Effect of dangling bonds of ultra-thin silicon film surface on electronic states of internal atoms
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