The specific W/L (width to length) ratio for different technologies depends on various factors, including the manufacturing process, device design, and the electrical characteristics desired. However, the channel width to length ratio is a key factor in determining the electrical performance of a MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) device, which is a common type of transistor used in microelectronics.
A common consideration for channel width with respect to channel length is that a larger W/L ratio results in a stronger electrical field and faster device performance. On the other hand, a smaller W/L ratio reduces the electrical field, which can reduce the risk of short channel effects, such as drain-induced barrier lowering (DIBL) and hot carrier injection (HCI).
However, the optimal W/L ratio depends on various factors, including the technology node, the desired electrical characteristics, and the trade-off between performance and reliability. For example, in advanced technology nodes, smaller transistors with high drive currents are typically desired for improved performance, which often requires a larger W/L ratio.
In general, the appropriate consideration of channel width with respect to channel length requires a careful trade-off between performance, reliability, and manufacturability. It is important to work closely with device and process engineers to determine the optimal W/L ratio for a specific technology and application.
For each technology, the width is varied from a particular range. One can opt any width depending for the requirement of the drain current and other parameters