ARPES study is the direct evidence for the topological insulating state. However, some of the trivial insulators can be transformed into non-trivial topological insulators by alloying, applying hydrostatic pressure or by applying strain in the quantum wells. Since ARPES can't be implemented at high pressure, high pressure XRD, high pressure Raman, high pressure electrical resistivity studies etc can be used to detect the changes during electronic topological transition (ETT) and topological quantum phase transition (TPQT). These signatures are only indirect evidences for either ETT or TPQT. In BiTeI, the TPQT signature is guessed by observing the behavior of P Vs FWHM of E2g phonon mode. Are there more evidences to distinguish between ETT and TPQT from high pressure XRD, Raman and electrical resistivity studies?.

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