I usually make perovskite film using spin coating on ITO substrate(Glass (2mm)/ITO (250nm)/Perovskite (300nm)). I want to analyze this film with TEM and I already know it generally make a TEM specimen with FIB to measure the cross-view.
Is there any method to measure the plan-view with TEM? If there is a way not to use FIB, I would appreciate it if you could tell me how to do it. The thickness of the substrate and perovskite layer can be adjusted or changed.
Hello,
A summary for FIB may be found here:
https://www.researchgate.net/post/How_to_prepare_plane_view_TEM_lamella_using_FIB
Planar lamellae can also be prepared using the classical methods.
Try to grow your films on fresh cleaved smooth NaCl substrates. After deposition dip one end of the substrate in water filled in a petri dish carefully. Dont just immerse the fil+ substrate into the water quickly, just dip onne end. You will see the film separating out from the NaCl substrate and floating on the water surface. Take Cu grid (TEM) with a fine tweezer and and go under he floating film, and lift it, allow it to dry for quite some time, and then take into your TEM. This is a standard technique, and has been explained in many old classic books. "handbook of thin film technology.
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