I want know how to determine the complex of the permittivity of the metals at optical frequencies. Is there any formula or technique to determine the complex permittivity?
Hi!
First of all there is already a lot of data available at: http://refractiveindex.info/
It includes different data sets of complex refractive index and permittivities at optical frequencies for different materials and also metals. The complex permittivities and refractive index are closely related and can be calculated by:
epsilon_1 = n^2-k^2 and epsilon_2 = 2nk (http://en.wikipedia.org/wiki/Refractive_index)
You can find also info in:
A. D. Rakić, A. B. Djurišic, J. M. Elazar, and M. L. Majewski. Optical properties of metallic films for vertical-cavity optoelectronic devices, Appl. Opt. 37, 5271-5283 (1998)
For experimental measurement i think the best method should be ellipsometry.
Best of luck.
Hi!
First of all there is already a lot of data available at: http://refractiveindex.info/
It includes different data sets of complex refractive index and permittivities at optical frequencies for different materials and also metals. The complex permittivities and refractive index are closely related and can be calculated by:
epsilon_1 = n^2-k^2 and epsilon_2 = 2nk (http://en.wikipedia.org/wiki/Refractive_index)
You can find also info in:
A. D. Rakić, A. B. Djurišic, J. M. Elazar, and M. L. Majewski. Optical properties of metallic films for vertical-cavity optoelectronic devices, Appl. Opt. 37, 5271-5283 (1998)
For experimental measurement i think the best method should be ellipsometry.
Best of luck.
Hi, absolutely agree with Siim Pikker that you should check the literature for optical constants data. If you work with thin films obtained by different deposition techniques it may happen the optical constants of your films to differ from the bulk counterparts. In this case it is better to determine experimentally n and k by elipsometry or spectrophotometry measurements.
Thank you for your brief discussion, dear Siim Pikker and Tsvetanka Babeva, yes I would be able to measure the complex refractive index of thin film, spectrophotometry measurement facility is available in my lab. Before this, I want to make the theoretical study of the thin film. Actually, I didn't know to compute imaginary permittivity by extension coefficient. Now I am able to calculate imaginary permittivity through extension coefficient for theoretical study.
Drude-Lorentz and Debye-Lorentz models are in case. Please, consider this technique
http://www.mathworks.com/matlabcentral/fileexchange/18040-drude-lorentz-and-debye-lorentz-models-for-the-dielectric-constant-of-metals-and-water
If you want retrieve the parameters from measurement, this method can be useful
http://effmetamatparam.sourceforge.net/
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