If your films have associated time constants, you can use electrical impedance spectroscopy and use the storage on your scope to display the Real/Imaginary impedances versus frequency. This is actually a very useful measurement especially when studying electrolytic interfaces.

Dear Cyril,

Yes of course. For more information message me via researchgate messenger.

If your films have associated time constants, you can use electrical impedance spectroscopy and use the storage on your scope to display the Real/Imaginary impedances versus frequency. This is actually a very useful measurement especially when studying electrolytic interfaces.

The electrical characterization of thin films can be accomplished by measuring its

conductivity and dielectric constant if it is insulating or semiconducting.

So you can use the resistance of a known a known thing film geometry and then you can calculate the conductivity. You can also measure the capacitance of the a specific geometry capacitor made from thin film and two metal electrodes.

You can use the oscilloscope to measure the voltage and current by a voltage across a current sensing resistance. Naturally you need a function generator and power supply. The oscilloscope can be used as a voltmeter and ammeter by measuring the voltage across sensing resistance Rm. You can use it to measure the phase between two sine wave forms and therefore you can measure the magnitude and phase of an impedance as the colleagues hinted imperviously.

There are more uses of the oscilloscope in measuring semicondcutor parameters:ttps://www.researchgate.net/publication/323428606_Measuring_the_semiconductor_parameters

Best wishes

To get the transfer characteristics for a MOS using Oscilloscope please read my book (The American University Laboratories For Electrical Engineering Part 1).