Theoretically, FT-IR, XPS, TGA can reveal a successful grafting of silicon coupling agent. However, all of these methods may show an ambiguous result,which is a bit reluctant to demonstrate an expected result. Take MPS for example, FT-IR may show a weak signal of carbon double-bond,which may be overlapped by signals of other group. So, does anyone has an effective idea about characterizing such coupling agents? Thanks!