If we measured the X-ray diffraction of single crystal and then we powdered the single crystal to measure the X-ray diffraction of the powder, is the two scans will be the same and have the same peaks at the same angles or not ?
The result of the XRD pattern will depend on several factors. Among them and perhaps the most important, the method used to pulverize the crystal, since it can influence the degree of crystallinity of the particle.