Dear all,

I have a sample with almost spherical particles from 20 to 400 nanometers. To get a good estimate of the number of both small and large particles, I performed the particle size analysis on secondary electron (SE) images acquired at different magnifications, i.e. 5000X and 10000X.

Now, to get a global (and more representative) particle size distribution, I would to combine the particle size analyses performed on the 5000X images with that carried out on the images acquired at 10000X.

However, I am not sure that this is scientifically correct, since the "global" particle size distribution is calculated from images acquired at differnt magnifications.

Do you have any suggestion, please?

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