I was challenged to identificate what kind of microscopy technique was used in five different images. The only information provided was the image, without other information, including scale bars that was omitted.
One of the images was assigned as TEM image from a freeze-fracture replication of a cell, but I have a doubt about it, as it resembles a SEM secundary electron image of a common surface of porous inorganic surface.
I'm not sure if is possiIble to differentiate this two kind of images just with the images and no other information. I'm not a microspist or a specialist in cell biology, but I'm a user of electron microscopy technique in materials science research field.
Can someone help me with this question?
Shadowing is a normal means for distinguishing a secondary SEM image from a TEM image. A secondary SEM image creates shadowing due to the secondary e- collector usually being to one side of the probe’s path.
However potential confusion can result in a carbon film due to variable thickness of the carbon film on various surfaces due to the variable angles often found on the surface of the fracture of interest, which can and often do collect varying amounts of carbon.
But, carbon films should show similar grain or particle structure or size, while SEM of differing surfaces should differ in particle size or structure.
Too, shadowing should be different.
Such can be a challenge.
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