I have collected single crystal X-ray diffraction data for a compound using a Rigaku diffractometer, but I am not familiar with the CrysAlisPro software to reduce the data (with overlaps of reflections in the reciprocal lattice). Is it possible to process the data using the Bruker APEX 3 suite? Or How can I separate twined component in Ewald 3D using CrysAlisPro?

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