is it possible identify defects( (point (vacancy) ,linear (dislocation),planar (grain boundary)) with HRTEM ? TEM? STEM?
Why not you read the famous books on TEM? Example, Fultz and Howe, Carter and Williams, etc...If they are not available in your library, even then you may download the books from the internet, although this is a violation of copyright of respective publisher.
Individual vacancies/interstitials might not be possible, but definitely, dislocations, grain boundaries and vacancy clusters can be observed using any of the above mentioned techniques.
Dear Yasir ,
please explain more about Individual vacancies/interstitials that might not be possible.
Perhaps the most controversial point is about individual vacancy, I remember once I read a paper in Appl. Phys. Lett., there was a report on HRTEM study about individual vacancy in GaN plan-view specimen, I am not sure if my memory is correct, you could search this literature.
There are plenty photographs in Google showing the observations of vacancies, divacancies, interstitials etc. made by HRTEM.
Functional Metal Oxide Nanostructures - Page 41 - Google Books Result
I strongly agree with Dear Oğurtani. Please also see our experimental papers for FENICU,FENIMN and FENIMNSICR etc. They will provide you a pre-insight.
All the best
Dear Abbas,
Thanks for posting your question, which has initiated such a stimulating discussion. I have been looking for a answer myself. Recently, I came across an online presentation which sort of points in the direction of your question. The file is attached.
Dear Volker ,
please explain about isolated vacancies more .do you have any examples or images ?
Dear Abbas almost halve a century passed by since the discovery of dislocation network in metal foil using TEM/ which was took place in Cambridge Cavendish laboratory, UK by Professor Sir Hirch and his coworkers. I have seen photographs of point defects and their clusters taken by HRTEM in Google platform. But could not copied and pasted them in this RC domain, Regards and Happy New Year!.
Dear Volker,
please send me one or more HRTEM ,TEM ,STEM contain defects (voids, dislocation and grain boundary) my e-mail.
All the best,Abbas
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