First of all, whether it is possible to identify the presence of water and its amount on the Silicon substrate by using only FT-IR spectroscopy.
Can ATR-FTIR spectroscopy find out the wettability of a corrugated Silicon surface?
Contact angle can be measured easily in goniometer. The instrument is there in MSC lab also and 139 A. From there you can measure the wettability also.
Yes u can do it on contact angle measurement device. While measuring the contact angle make sure that the base line is accurately drawn may be at the upper crust of rough surface in all the samples.
Basanta Kumar Parida thanks for your response,
As wetting (efficiency of liquid adsorption or the tendency of a liquid drop to spread over a flat surface) increases, the contact angle decreases.
so, is the wetting less (more contact angle) for rippled wafer as compared to a flat Silicon wafer?
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