In an X-ray diffraction (XRD) pattern, the intensity of a diffraction peak is primarily related to the number of atoms within the crystal that contribute to the scattering of X-rays. This intensity also reflects the quality and degree of crystallinity of the sample. Higher intensity peaks indicate greater crystallinity and more ordered atomic structures.
If the intensity of some peaks changes while others remain constant, it may indicate the preferred orientation within the sample. This means that certain crystallographic planes are more aligned or oriented in a particular direction compared to others.
If the intensity change is observed across all peaks in the XRD pattern, it could indicate a systemic influence, such as a temperature effect. Temperature changes can affect the overall crystallinity and structural integrity of the sample, leading to uniform changes in peak intensities. Similarly, the amount of sample, which correlates to the number of atoms available for scattering, can also influence the intensity of the X-ray diffraction (XRD) peaks.
Dear Satyasadhan Dowarah ,
you are dealing with film samples and not powder.
So Akash Ghosh is right when mentioning the preferred orientation aspect.
You may use a spinning sample stage to reduce the preferred orientation artifacts. However, there is no guarantee that they will be removed completely...
Best regards
G.M.
Satyasadhan Dowarah PXRD data output intensity vs 2 theta, then the intensity will be an arbitrary unit, So you can get different intensities.
But in most cases intensity ratio will be the same. otherwise, if you get a different ratio it means that the highly grown phase shows high intensity.
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