I dopant 3% Stronium into TiO2, but after doping there is no change in the XRD patterns and DRS....
At least for XRD: you should simply simulate the diffraction pattern for both cases and compare them. Then you need to consider experimental challenges. "There is no change" is practically impossible. If you prepare two samples you ALWAYS find differences. The question is how accurate you are looking. In order to get an idea how accurate you have to work, the simulation will help you. Everything else is your responsibility (measurement setup, sample preparation etc)
I think you need to relook at the concentration of dopants. Usually, the techniques that you are using, it is very difficult to see any change if the concentration is too low.
I will Suggest you use GI XRD instead of powder XRD. Ideally, in normal XRD, you can not observe very low-intensity phases or signals because the electron beam is getting much deeper than your expectation. GI XRD is favorable to those have low intensity.
You may try to check whether Sr entered your TiO2 phase using ED microanalysis on SEM because there is certain possibility that Sr formed its own phase because of big dopant concentration and an amount of that phase is too low to see via XRD.
Probably your additive formed a solid solution with the main phase. Or it is just not detected by XRD due to the low concentrations.
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