I have several samples that have been mounted however the sample height differs, which means the working distance will differ as well. May I know how this will influence the the image captured in SEM? Will the magnitude and scale comparable for the samples?
Magnification will be the same (at least it is right for computerized microscopes manufactured in 21 century). If magnification calibration was not performed on SEM, then minor variations in magnification are possible. You can check it changing working distance by movement along Z axis. Anyway, in most cases you can set the same working distance for all specimens with the help of Z axis movement.
Magnification will be the same (at least it is right for computerized microscopes manufactured in 21 century). If magnification calibration was not performed on SEM, then minor variations in magnification are possible. You can check it changing working distance by movement along Z axis. Anyway, in most cases you can set the same working distance for all specimens with the help of Z axis movement.
As Dr. Dusevich said, just use Z axis movement and adjust the same WD for all samples. Be careful with the movement - samples with different height on the stage is the most common cause of mechanical damages: when one adjusts WD for the lowest sample, the highest can strike detectors and other interior parts of the SEM. It can be very expensive.
Good luck!
Agree with the above answers. In general the z-distance affects the intensity of your signal. You will notice the difference in the backscatter signal, and likely in the x-ray signal.
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