Usually, X-ray reflectivity is measured without any condition on coherence of incident beam. What can be the effect of beam coherence on reflectivity pattern. We are concerned with vertical coherence here.
Dear Gerhard Martens , thanks for your response. I apologize for not being clear in the question. By vertical coherence, I meant the incident beam has transverse coherence. For this incident beam, whether the reflectivity pattern will be modified from the one obtained using incoherent beam< If yes, then how?
if 2 beams superimpose, their phaseshift phi decides the resulting intensity. For coherent beams, the phaseshift is constant and you can exact calculate the resulting intensity I:
I = I1 +I2 + 2*(I1*I2)0,5*cos(phi)
Whether the phaseshift is equal to zero or 180° depends on the refractive indize's of incident n1 and refractive n2 medium.
For n2 > n1 you have phi = 0, otherwise phi = 180 °. That means, cos( phi) = 1 or cos( phi) = -1 (stitch like at a mirror). The intensities add geometrically (the field strength arithmetically)
For incoherent radiation the cos(phi) is zero and the intensities add arithmetically.
I add some lecture notes (sorry in german), but it can help to clarify.