I have deposited the polycrystalline thin film of BiFeO3 multiferroic thin film using Pulsed laser deposition. XRD curve depicts the (100), (200) and (110) orientations.
Did u mean the degree of particular plane, like which plane is the most probably present in your thin film? You can calculate the value of MRD (multiple random distribution) of the thin film and tabulate it. Though i am not sure about your specific question without looking the XRD data. I can't give pretty good suggestion.
You can refer this article for MRD calculation.
M A Mccormick, E B Slamovich, Journal of Europen Ceramic Society, 2003, 23, 2143-2152.
In XRD, there can be preferred orientation of peaks either in bulk or thin film samples. The simplest way to check the orientation is to calculate the ratio of intensities of peaks with respect to (110) reflection, which is the highest intensity reflection as mentioned in the reference database.
All peaks ratio of intensity will follow the standard trend in case no texture (or preferred orientation). A example of database entry from JCPDS is given below.
Phase Info [01-072-2035] BiFeO3 ● Bismuth Iron Oxide
Name: Bismuth Iron Oxide
Formula: BiFeO3
Powder Pattern (QM: Calculated)
Radiation: CuKa1
λ: 1.54060 Å
Filter:
Calibration:
2θ: 89.53°
Lines: 25
RIR: 8.81
Reference: Calculated from ICSD using POWD-12++ (1997)