I have a sample and top surface is a layer of WC done with different method. There is a crack on the interface. User is questioning that there is a oxide layer and not a crack.
if you suspect that an oxide layer has formed, my suggestion would be to run a simple EDX mapping around and at this location. Then you see the local elemental distribution. An XRD analysis does not make too much sense in my opinion, since you would need some interaction volume of the oxide layer and crystallinity to see clear nice peaks in the XRD pattern. Besides EDX you could also try XPS.
Dear Nancy Zhang I agree completely with Mark-Daniel Gerngross , EDX will do the job in a fast and easy way as XPS too. Furthermore, you can show that it is a crack by zooming. The image you uploaded shows a 300um scale-bar, so you could place your sample in a SEM and get a closer look. If an oxide layer was formed on any of the crack´s sides or not will be clear with the previous techniques. In this way you will have a topographical and a chemical prove.
By the size of the probed sample 300um, a micro XRF or EDS would be enough to determine if already some sort of oxide is present at the sample surface.
Z mapping the surface as suggested by Mark-Daniel Gerngross is another option; in fact, it can show oxide occurrences in some other points in the surface area. It may indicate boundaries phenomenons or undesirable reactions induced by defects.
If already have an amplified SEM of the same sample, better checking may help decide if a crack is already present or an alined oxide exists.
If so, both sides seem to have the same occurrence, maybe some boundary feature, that deserves a closer inspection.
Perhaps, something that can be prevented.
Stress transition area, lack of stoichiometry, even some impurity that rise favorable deposition condition or stoichiometry break out, resulting in the visible phenomenon.