I have used Keller's reagent till now but I am not able to see silicon network in SEM. I am also facing problem in etching. Some times I can see the microstructure in Optical Microscope but not able to see silicon network in SEM in same sample.
Kindly guide me please.
Here are some suggestions: Ensure the sample is properly polished and metallized to prevent electrostatic charging and enhance conductivity. Make sure SEM parameters are correctly configured, including acceleration voltage and beam current, to achieve good resolution and contrast. Test various etching techniques to effectively reveal the material's structure, adjusting concentrations and etching times as needed. Utilize the backscatter (BS) mode of the SEM, which can provide better sensitivity to compositional variations and improved visualization of the silicon network.
good luck.
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