I am learning Whole Powder Pattern Modelling (WPPM using PM2K) of powder XRD data to estimating microstructural properties. In this approach peak intensities are treated as free fitting parameters (similar to Le Bail fitting).

As per literature it is possible to perform simultaneously structural (Rietveld like) and microstructural analysis using this software. This will be helpful to separate/constrain the intensity ratios of strongly overlapped XRD profiles (for example: single phase matrix with two different microstructures).

I have not found complete information to prepare input file in this case (in PM2K User Manual – Ver 2.10 October 2011 as well).

Could someone please provide the details of input file for simultaneously structural (Rietveld) and microstructural analysis using PM2k. Are plugins (scatFactor.dll and Structure.dll) useful? If so, how to use them?

Or any other document/manual/website details where these parameter details are available?

The details of WPPM and PM2K software using are as per following references:

. M. Leoni, T. Confente & P. Scardi, “PM2K: a flexible program implementing Whole Powder

Pattern Modelling”, Z. Kristallogr. Suppl. 23 (2006) 249-254.

· P. Scardi, M. Leoni,, “Whole Powder Pattern Modelling”, Acta Crystall. A 58 (2002) 190-200.

Thank you...