During the measurement of I-V curve in a metal-organic Schottky junction diode, getting lots of fluctuations. I have attached some files here. Need suggestions to avoid this thing. Tell me the physical reason behind it and the parameters I need to improve. (voltage ranges from -3V to 3V, data point 50, compliance 0.01)
Thanks.
It looks to be a measurement noise .The practical solution is signal smoothing. Verify the resolution of your instrument (how many bits) and, if possible, set a lower current range. From your records, I estimate the lowest readable unit to be close to 1.10-7 A.
My suggestion: use a better measuring device.
Dear Subhajit,
welcome,
I agree with Cornel that these fluctuations are not due to device performance. They seem to be quantization errors.
If your resolution of your A/D converter is better with small quantization errors, the fluctuations will be smaller and for for more fine resolution these artifacts may not be observable.
In order to assess the Schottky diode for solar cell operation, you have to measure the reverse and forward characteristics. In addition when measuring the forward characteristics you have to measure it for much larger currents say mA/ cm^2. Then you apply light and see the illuminated i-v characteristics.
However, i wonder about the too high cut in voltage of the Schottky diode!!!
Another important comment is the presence of inflection points, they may be due to that you did not stabilized the contact by post annealing.
Best wishes
Dear C. Radu and Prof. A. Zekri,
Thank you very much for your valuable suggestions. I will try the post annealing method as you suggest. One more thing, how the diode performance varies with thickness of the electrode deposited?
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