First we have to compare the data with JCPDS data and then assign (h,k,l) to the corresponding angles. After this we proceed to calculate the crystal parameters from this
See attached a comparison of ZnO and ZnO-doped materials so initially if you compare the change in your peak positions from the initial pattern of your ZnO it will give you an idea of the change in the unit cell parameters as a consequence of incorporation of Cu. (I couldn't find a pattern for CuZnO2 so looked at Cu-Ni-ZnO and Ni-ZnO as you would expect a similar shift in patterns (due to comparable size etc)). If you need to examine the pattern more closely see the comments above and consider Rietveld refinement - see basic XRD books - this is a link for a decent booklet on the basics that is available online:
http://www.panalytical.com/Technology-background/XRD-for-the-analyst-getting-acquainted-with-the-principles-booklet.htm
Use the software Match! 2 of crystal impact. It is available online:
http://www.crystalimpact.com/match/
Just open your .raw file (XRD pattern file) using this program. It will automatically fit the peaks and identify the phases present there. You can also find out the (hkl) from this. After that calculate the lattice parameter and crystallite size using Scherrer Formula.
Dear Yashad Josh,
Xpert software is the best program for detect of your peaks.
If you have any problem, don't worry to call me.
Can you be more specific in your question. It is too general to give a useful answer. What information are you interested in extracting from your XRD pattern. What type of instrument and geometry was the data taken with (attaching a scan would be very helpful to be able to see the data type and quality and suggest what can and cannot be extracted and how). Look forward to hearing more about your questions.
- Badges
- Science topic
- Similar topics
- Filing