Average roughness of a laser ablated spot was measured using AFM and optical profilometer, I would like to estimate the improvement in surface area after laser ablation due to the roughness.
Since the roughness parameter is only defined with respect to height and not with respect to island/feature diameters, it is not sufficient.
My suggestion would be to export the (processed) AFM image to an XYZ file; from there, you can convert the z data into a matrix form e.g. with Excel or Calc. From this matrix, you can calculate line integrals for each X/Y sweep. Then you multiply the mean x and y line integral values and you should have a decent approximation for your new surface area.
If you have generated an Excel/Calc sheet for that once, you can reuse it by just copy-pasting new XYZ files into it as long as you don't change your image dimensions or pixel numbers.
Dear Sooraj,
Please refer to this connex issue on RS for answering your question: https://www.researchgate.net/post/how_to_calculate_actual_surface_area_of_a_rough_square_specimen_roughness_is_about_20_micron
Regards
That's an interesting question. One thumb and estimation method is to use surface roughness. The surface is actually composed of elevations such as peaks and valleys that have a triangular shape and the roughness measurement gives the average level of this value. As the surface roughness increases, the height of the peaks and valleys increases. With trigonometric relations such as sine and cosine, you can calculate the amount of surface increase. In fact, you increase the height of the triangle (roughness test result), then you calculate the chord size (added length)
I just saw that Gwyddion has a surface area determination tool:
http://gwyddion.net/documentation/user-guide-en/statistical-analysis.html#stat-quantities
(search for paragraph "hybrid"). I haven't used that function yet, should you try it, can you tell us whether the results make sense?
In addition to my previous post in relation with Developed Ratio (Sdr) from ISO 25178 Standard Series on areal surface texture, follow :
- F. Blateyron, "Proposed Corrections for the ISO 25178 Standard Series on Areal Surface Texture", 2015 -
Article Proposed corrections for the ISO 25178 standard series on ar...
Jürgen Weippert thank you. I have tried it, yes it has an option to measure the surface area.
Dear Sooraj Shiby
Sdr or Smr would be good parameters to characterize your process. However be careful when using AFM and optical profilers, as they have very different ranges and resolutions, so careful filtering is needed to compare results obtained by these two techniques.
Which AFM and optical profiler are you using and which resolution on each one?.
Best regards
Paco
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